Temperature Control Production Line System
Successfully shortened temperature control significantly with voltage feedback control of FPGA.
We have successfully reduced the temperature control time significantly using voltage feedback control with NI's FPGA. Previously, pressure control required measuring a large number of products at once due to the relationship with temperature control time. This necessitated creating a larger chamber for pressure control, resulting in longer stabilization times. By introducing NI's FPGA, the faster temperature control has allowed us to reduce the number of measurements taken at once. Consequently, we were able to make the pressure control chamber smaller, successfully shortening the pressure stabilization time. Furthermore, we achieved simultaneous measurement of multiple targets using DAQ for voltage and current measurements. This significantly reduced the time required for measurement conditions and multiplied the measurement speed. Initially, the measurement time for a single measurement was 300 seconds for 400 units, which is 0.75 seconds per unit. However, by adopting NI products, the measurement time for a single measurement has been reduced to 3 seconds for 112 units, resulting in approximately 30 times faster measurement at 0.026 seconds per unit.
- Company：ペリテック 神奈川エンジニアリングセンター、東京営業所、ベトナム事業所
- Price：Other
